Microimpact Testing System

The MicroImpact Testing System is designed for R&D or process quality control of microelectronic devices. It has the ability to achieve shear speed from .2 m/s to 1 m/s using a patented low-inertia load transducer. The use of an LVDT is incorporated with the striker to collect the force and displacement data. This direct attachment of the load cell to the striker minimizes noise from the machine response.