Materials Analysis

A new version of the LSM 5 PASCAL confocal laser scanning microscope has been designed for materials research and quality inspection. Performance capabilities have been extended with special functions for quantitative surface analysis and characterization such as roughness and volumetric measurement as well as bearing ratio. An expanded topography package considerably improves the capabilities for non-contact 2D and 3D surface analysis. In addition to the convenient acquisition, processing and presentation of xyz image stacks, the package now also allows recording of xz profiles along with a straight line or free-hand curve.
www.zeiss.com/micro
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