Total Quality Microscopy
Deep View increases the depth of field of high-aperture objectives in near real time while retaining diffraction-limited image quality. C-DIC (Circular DIC) makes sample structures that were once visible only in a certain preferential direction clearly seen in their entirety, regardless of their orientation and without rotating the sample stage. TIC (Total Interference Contrast), a new polarization/optical shearing microinterferometer, allows topographic measurement work to be carried out in circular polarized light, enabling rotation of the TIC prism without contrast alteration of the interference pattern or stage rotation, making sample alignment simple. Measurement range is from 20 nm to 10 Km, with interferometric accuracy of 1/100 l.